International Workshop on Astronomical X–Ray Optics
Prague 2010
Poster details
Recognition of bad pixels on charge-coupled devices through statistical analysis of event lists
Presenter: Michael Wille
We present an algorithm for the detection of defective pixels on charge-coupled devices (CCDs) by statistical means. For this purpose we show a way to organize and divide the event data into logical chunks which the recognition algorithm can operate on afterwards. We demonstrate the results of our tests with real event data taken by XMM-Newton and discuss the performance of the detection tools which prove to securely detect bad pixels with a mean signal of about 2*sigma above background level. As the reliable detection of bad pixels is of great importance for instrument health checks, we conclude that our toolset should not be used in a completely autonomous environment, but under regular human supervision.
Jörn Wilms
Ingo Kreykenbohm
Christoph Großberger
Christian Schmid
Johannes Hölzl