Presentation details

Stacks of silicon wafers: mechanical point of view

Presentation duration: 15 minutes

Presenter: Rene Hudec

We will give a short discussion of new results obtained within ESA PECS project in design of X-ray optics modules based on silicon wafers stacks. They cover internal stress analyses and vibration tests.

Marsikova V, Pina L., Inneman A., Hudec R., Marsik J.

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